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Printing Copper Multilayers with VIAs on 3D Surfaces using Laser Material Processing
- Authors:
- Series:
- Berichte aus dem ITA, Volume 04/2024 E-Book
- Publisher:
- 2024
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Bibliographic data
- Copyright year
- 2024
- ISBN-Print
- 978-3-69030-012-4
- ISBN-Online
- 978-3-69030-012-4
- Publisher
- TEWISS, Garbsen
- Series
- Berichte aus dem ITA
- Volume
- 04/2024 E-Book
- Language
- German
- Pages
- 175
- Product type
- Book Titles
Table of contents
ChapterPages
- Titelei/Inhaltsverzeichnis No access Pages I - XVI
- 1. Introduction No access Pages 1 - 4
- 2.1. 3D Structural Electronics No access
- 2.2. Printed Electronics No access
- 2.3. Laser Material Processing No access
- 2.4. Conclusion No access
- 3.1. Multilayer Printing Approach No access
- 3.2. Sub-goals Specification No access
- 3.3. Sub-goals Structure No access
- 4.1. Laser Systems No access
- 4.2. Copper and Insulator Inks No access
- 4.3. Sample Preparation No access
- 5.1. Laser Sintering of Copper Ink No access
- 5.2. Laser Cleaning of Copper Ink No access
- 5.3. Laser Ablation of Insulator Ink No access
- 5.4. Laser System Assessment No access
- 6.1. 3D Surface Priming with Insulator Ink No access
- 6.2. 3D Laser Sintering of Copper Ink No access
- 6.3. 3D Laser Cleaning of Residual Ink No access
- 6.4. 3D Single-Layer Demonstrators No access
- 7.1. Resistance Model No access
- 7.2. Double-Layer VIA Test Design No access
- 7.3. Process Optimization No access
- 7.4. Conclusion No access
- 8.1. 3D Double-Layer Resonator Circuit No access
- 8.2. 3D Double-Layer LED Circuit No access
- 8.3. 3D Double-Layer Multidirectional Lighting Circuit No access
- 8.4. 2D Five-Layer Contact Pad Array No access
- 9. Conclusion No access Pages 115 - 116
- 10. Outlook No access Pages 117 - 118
- A. Mechatronic Integrated Device Geometry Classification Schematics No access
- B. Multilayer Device Geometry and Technology Nomenclature No access
- C. Technical Data of Laser Marking Systems No access
- D. Material Data of the Functional Inks and Pastes No access
- E. Sintering Parametrization Resistance Measurements No access
- F. Cleaning Parametrization Depth Measurements No access
- G. Ablation Parametrization Depth and Width Measurements No access
- H. Process Development Resistance Measurements No access
- I. 3D Double-Layer Multidirectional Lighting Circuit No access
- List of Figures No access Pages 141 - 143
- List of Tables No access Pages 144 - 145
- Bibliography No access Pages 146 - 164
- Relevant Publications No access Pages 165 - 175





